{"id":846,"date":"2016-07-14T10:53:02","date_gmt":"2016-07-14T01:53:02","guid":{"rendered":"http:\/\/www.waseda.jp\/inst\/nanolife\/?p=846"},"modified":"2017-05-02T13:02:20","modified_gmt":"2017-05-02T04:02:20","slug":"si%e3%83%8a%e3%83%8e%e3%83%af%e3%82%a4%e3%83%a4%e3%83%bc%e3%81%ae%e6%ad%aa%e5%88%86%e5%b8%83%e3%81%a8%e6%96%ad%e9%9d%a2%e5%bd%a2%e7%8a%b6%e3%82%92x%e7%b7%9a%e5%9b%9e%e6%8a%98%e3%81%a7%e5%ae%9a","status":"publish","type":"post","link":"https:\/\/www.waseda.jp\/inst\/nanolife\/news\/2016\/07\/14\/846\/","title":{"rendered":"Si\u30ca\u30ce\u30ef\u30a4\u30e4\u30fc\u306e\u6b6a\u5206\u5e03\u3068\u65ad\u9762\u5f62\u72b6\u3092X\u7dda\u56de\u6298\u3067\u5b9a\u91cf\u89e3\u6790\u53ef\u80fd\u306b"},"content":{"rendered":"<h6>\u201cAnalysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution\u201d<br \/>\n<b><i>Thin Solid Films<\/i><\/b> vol.612 (2016) pp.116\u2013121<\/h6>\n<h6>\u30ca\u30ce\u30fb\u30e9\u30a4\u30d5\u5275\u65b0\u7814\u7a76\u6a5f\u69cb\u3000\u7814\u7a76\u9662\u6559\u6388\u3000\u7af9\u5185\u8f1d\u660e\u3089<\/h6>\n<h4><b>\u30ad\u30fc\u30ef\u30fc\u30c9\uff1aSi<b>\u30ca\u30ce\u30ef\u30a4\u30e4\uff0c<\/b><b>\u6b6a\u5206\u5e03\uff0c<\/b><b>\u53f0\u5f62\u65ad\u9762\uff0c<\/b><b>X<\/b><b>\u7dda\u56de\u6298\uff0c\u30b7\u30f3\u30af\u30ed\u30c8\u30ed\u30f3<\/b><b>\u653e\u5c04\u5149<\/b><\/b><b><br \/>\n<\/b><\/h4>\n<h2>\uff0a\u6210\u679c\u306e\u30dd\u30a4\u30f3\u30c8<a href=\"http:\/\/www.waseda.jp\/inst\/nanolife\/assets\/uploads\/2016\/07\/nanowire1.png\"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-849 alignright\" src=\"http:\/\/www.waseda.jp\/inst\/nanolife\/assets\/uploads\/2016\/07\/nanowire1-610x741.png\" alt=\"nanowire1\" width=\"372\" height=\"452\" srcset=\"https:\/\/www.waseda.jp\/inst\/nanolife\/assets\/uploads\/2016\/07\/nanowire1-610x741.png 610w, https:\/\/www.waseda.jp\/inst\/nanolife\/assets\/uploads\/2016\/07\/nanowire1.png 618w\" sizes=\"auto, (max-width: 372px) 100vw, 372px\" \/><\/a><\/h2>\n<ul>\n<li>300nm\u5468\u671f\u3067\u914d\u5217\u3057\u305fSi\u30ca\u30ce\u30ef\u30a4\u30e4\u30fc\u3092\u4f5c\u88fd\u3057(Fig.1)\u3001X\u7dda\u56de\u6298\u5b9f\u9a13\u3092\u5b9f\u65bd\u3002\u30ca\u30ce\u30ef\u30a4\u30e4\u30fc\u3068\u57fa\u677f\u3068\u306f\u7d50\u6676\u65b9\u4f4d\u304c\u540c\u3058\u3067\u3042\u308b\u304c\u3001<strong>\u30ca\u30ce\u30ef\u30a4\u30e4\u30fc\u306e\u5e72\u6e09\u52b9\u679c\u3092\u7528\u3044\u3066\u3001\u57fa\u677f\u306e\u56de\u6298\u3092\u9664\u53bb\u3057\u3066\u30ca\u30ce\u30ef\u30a4\u30e4\u30fc\u306e\u56de\u6298\u306e\u307f\u3092\u89b3\u6e2c\u3057\u305f<\/strong>(Fig.2) \u3002<\/li>\n<li>\u89e3\u6790\u306f\u3001\u4f4d\u76f8\u3092\u8003\u616e\u3057\u6b6a\u5206\u5e03\u3068\u65ad\u9762\u5f62\u72b6\u3092\u4eee\u5b9a\u3057\u3066\u3001X\u7dda\u6563\u4e71\u632f\u5e45\u3092\u5168\u9818\u57df\u3067\u7a4d\u5206\u3057\u3066\u6c42\u3081\u305f\u56de\u6298\u5f37\u5ea6\u7406\u8ad6\u66f2\u7dda\u3092\u5b9f\u9a13\u66f2\u7dda\u3068\u6bd4\u8f03\u3057\u3066\u884c\u3063\u305f\u3002<\/li>\n<li><strong>\u6b6a\u306b\u306f\u6b63\u306e\u3082\u306e\u3068\u8ca0\u306e\u3082\u306e\u3068\u304c\u5171\u5b58\u3059\u308b\u3053\u3068\u304c\u5206\u304b\u308a\u3001\u304b\u3064\u3001\u305d\u308c\u3089\u3092\u5b9a\u91cf\u7684\u306b\u6c42\u3081\u308b\u3053\u3068\u306b\u6210\u529f\u3057\u305f<\/strong> (Fig.3a)\u3002\u307e\u305f\u3001\u65ad\u9762\u3092\u53f0\u5f62\u3068\u4eee\u5b9a\u3059\u308b\u3068\u7406\u8ad6\u306e\u56de\u6298\u66f2\u7dda\u304c\u5b9f\u9a13\u66f2\u7dda\u3068\u3088\u304f\u5408\u3046\u3053\u3068(Fig.3b)\u3082\u5224\u660e\u3002<\/li>\n<li><strong>\u6b6aSi MOS-FET\u306e\u89e3\u6790\u3084\u5468\u671f\u69cb\u9020\u3092\u6709\u3059\u308b\u30d5\u30e9\u30c3\u30b7\u30e5\u30e1\u30e2\u30ea\u7d20\u5b50\u8a55\u4fa1\u3078\u306e\u5fdc\u7528\u304c\u671f\u5f85<\/strong>\u3055\u308c\u308b\u3002<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>\u201cAnalysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution\u201d Thin Solid Films [&hellip;]<\/p>\n","protected":false},"author":3,"featured_media":848,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[1],"tags":[28],"class_list":["post-846","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","tag-research","lang-ja"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/posts\/846","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/comments?post=846"}],"version-history":[{"count":0,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/posts\/846\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/media\/848"}],"wp:attachment":[{"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/media?parent=846"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/categories?post=846"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.waseda.jp\/inst\/nanolife\/wp-json\/wp\/v2\/tags?post=846"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}